2020 IEEE International Test Conference India 2020
DOI: 10.1109/itcindia49857.2020.9171797
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Cited by 2 publications
(1 citation statement)
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“…The authors of [23] proposed a runtime dynamic Built-In Self-Repair (BISR) technique to improve runtime reliability. For that, they used a test scheme to identify runtime and manufacturing defects.…”
Section: Related Workmentioning
confidence: 99%
“…The authors of [23] proposed a runtime dynamic Built-In Self-Repair (BISR) technique to improve runtime reliability. For that, they used a test scheme to identify runtime and manufacturing defects.…”
Section: Related Workmentioning
confidence: 99%