Abstract:Abstract-With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transparent latches are widely used. In this paper, we formulate and solve the binning optimization problem that decides the bin boundaries and their testing order to maximize the benefit (considering the test cost) for a transparentlylatched circuit. The problem is decomposed into three sub-problems which are solved sequentially. … Show more
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