1979
DOI: 10.1109/isscc.1979.1155891
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Abstract: Scan Design (LSSD)' '' -found t o be a solution to the problem of testing LSI chips and printed circuit board assemblies, will be discussed. Automatic test pattern generation can be performed on the LSSD networks. The circuit overhead for LSSD is low, and the method is compatible with all LSI logic technologies. Figure 1 shows an LSSD network. The initial step in testing the network is the application of test patterns which insure that logic signals can be propagated through the shift registers. An automatic …

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