2019
DOI: 10.3390/min9090527
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Automated SEM Mineral Liberation Analysis (MLA) with Generically Labelled EDX Spectra in the Mineral Processing of Rare Earth Element Ores

Abstract: Many rare earth element (REE) deposits have experienced multistage geological enrichment processes resulting in REE bearing mineral assemblages of considerable complexity and variability. Automated scanning electron microscopy (SEM) mineral liberation analysis of such REE ores is confronted by the difficult assignment of energy-dispersive X-ray (EDX) spectra to REE mineral names. To overcome and bypass this problem, a generic and reliable labelling of EDX reference spectra obtained from REE-bearing minerals ba… Show more

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Cited by 44 publications
(31 citation statements)
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References 33 publications
(45 reference statements)
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“…Silicon drift energy dispersive X-ray detector (SDD) technology, with its high count rates, good energy resolution, and large effective area, permits characterizing minerals within seconds. Extended atomic databases included in the EDS software improve the identification and quantification of elements with overlapping peaks, due to the thin active layer which suppresses the Compton background [38][39][40].…”
Section: Scanning Electron Microscopy and Elemental Analysismentioning
confidence: 99%
“…Silicon drift energy dispersive X-ray detector (SDD) technology, with its high count rates, good energy resolution, and large effective area, permits characterizing minerals within seconds. Extended atomic databases included in the EDS software improve the identification and quantification of elements with overlapping peaks, due to the thin active layer which suppresses the Compton background [38][39][40].…”
Section: Scanning Electron Microscopy and Elemental Analysismentioning
confidence: 99%
“…The contribution of generically labelled EDS spectra in the mineral processing of rare earth element ores by Schulz et al [21] provides a possibility for how to relate the EDS spectra from the complex and variable REE mineral phases in an ore to mineral names. The labelling of the spectra obtained from REE-bearing minerals is based on their contents of Si, Ca, F and P in a bulk normalised analysis.…”
Section: The Special Issuementioning
confidence: 99%
“…These EDX spectra have characteristic peaks at distinct positions in the keV scale and distinct relative cts/s, allowing identification of the major elements present and providing a semiquantitative indication of their concentrations. The SEM-MLA software (version MLA 3.1 by FEI) recognizes each mineral phase after its EDX spectrum by comparison to a reference set of EDX spectra from identified mineral phases with known compositions [7,8]. The mode of recognition is straightforward for phases larger than several microns, but this is not always the case for the rhyolitic matrix.…”
Section: Mineral Liberation Analysesmentioning
confidence: 99%
“…To achieve this, automated detection is helpful to obtain a representative catalogue of zircon populations. So far, automated Scanning Electron Microscope Mineral Liberation Analysis (SEM-MLA) has been applied in the industry for solving problems of ore mineral processing and extraction [7]. However, there are other assets of automated SEM methodology, including the detailed modal analysis of different rocks [8,9] or quantification of environmental weathering [10,11].…”
Section: Introductionmentioning
confidence: 99%