MRS Proc. 1998 DOI: 10.1557/proc-524-49 View full text
Jin-Seok Chung, Gene E. Ice

Abstract: ABSTRACTThird generation hard x-ray synchrotron sources and new x-ray optics have revolutionized x-ray microbeams. Now intense sub-micron x-ray beams are routinely available for x-ray diffraction measurement. An important application of sub-micron xray beams is analyzing polycrystalline material by measuring the diffraction of individual grains. For these measurements, conventional analysis methods will not work. The most suitable method for microdiffraction on polycrystalline samples is taking broad-bandpass …

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