DOI: 10.1109/date.2004.1268984
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Abstract: Noise analysis and power distribution network reliability assessment is extremely important in deep sub-micron digital and mixed-signal circuit design. Both relate closely to the nonlinear loading impact of digital circuits. Consequently, accurate estimation of the latter is critical. In this paper, we present extraction techniques that automatically generate a family of small, time-varying macromodels for digital cell libraries, at the time of their library characterization. Our approach is based on importin…

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