2019
DOI: 10.1038/s41563-019-0470-9
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Author Correction: Impacts of surface depletion on the plasmonic properties of doped semiconductor nanocrystals

Abstract: In the version of this Letter originally published, the isotopic enrichments in the caption of Fig. 1a were incorrectly given as "red-10 B 98.7%, purple-natural abundant, brown-10 B 51%, cyan-11 B 83% and blue-11 B 99.2%"; they should have read "red-11 B 99.2%, purple-natural abundant, brown-10 B 51%, cyan-10 B 83% and blue-10 B 98.7%".

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(3 citation statements)
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“…In2O3 NCs have been used as model system to study the contributing factor of LSPR in semiconductor NCs such as crystal structure, 15 NC size, 56 dopant distribution, 57 surface depletion, 58 strain effect, 30 and ensemble broadening 59 (Figure 1. 30 It is proposed that the relatively similar sizes between Ce 4+ and In 3+ ions minimize the lattice strain and lead to high electron mobility and thus the narrow LSPR band width.…”
Section: Contributing Factors Of Lspr In Semiconductor Ncsmentioning
confidence: 99%
See 1 more Smart Citation
“…In2O3 NCs have been used as model system to study the contributing factor of LSPR in semiconductor NCs such as crystal structure, 15 NC size, 56 dopant distribution, 57 surface depletion, 58 strain effect, 30 and ensemble broadening 59 (Figure 1. 30 It is proposed that the relatively similar sizes between Ce 4+ and In 3+ ions minimize the lattice strain and lead to high electron mobility and thus the narrow LSPR band width.…”
Section: Contributing Factors Of Lspr In Semiconductor Ncsmentioning
confidence: 99%
“…systematically investigated electrochemical modulation of the ITO NCs with different sizes and Sn doping concentrations 58. They observed the significant shift of LSPR frequency for small ITO NCs with low doping concentrations during the electrochemical charging/discharging (Figure1.4 c).…”
mentioning
confidence: 99%
“…It should be noted that such ultra-narrow (< 1nm) depletion layers are rarely reported (for example,S n:In 2 O 3 nanocrystals). [30] Therelationships between the W,particle size,and N d are illustrated in Figure 5d.S amples with larger NP sizes in the MC had relatively lower concentrations of interfacial V O in the bulk, resulting in relatively lower N d and higher W values.W ith ah igher W,t he extent of charge recombination was greater owing to the increased hole migration distance, and the resulting lower surface hole density led to slower water oxidation kinetics (Supporting Information, Figure S20).…”
Section: Forschungsartikelmentioning
confidence: 95%