2019
DOI: 10.1021/acsnano.8b09575
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Atomic-Scale Characterization of Graphene p–n Junctions for Electron-Optical Applications

Abstract: Graphene p-n junctions offer a potentially powerful approach towards controlling electron trajectories via collimation and focusing in ballistic solid-state devices. The ability of p-n junctions to control electron trajectories depends crucially on the doping profile and roughness of the junction. Here, we use four-probe scanning tunneling microscopy and spectroscopy (STM/STS) to characterize two state-of-the-art graphene p-n junction geometries at the atomic scale, one with CMOS polySi gates and another with … Show more

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Cited by 17 publications
(29 citation statements)
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“…In particular it rules out the importance of junction roughness (see ref. 53 ) or frozen disorder in controlling CR’s transmission. The former should lead to appreciable deviations from Fresnel relations and the latter to a saturation of the phonon mean-free-path effect at low temperature, both of which are not observed.…”
Section: Resultsmentioning
confidence: 99%
“…In particular it rules out the importance of junction roughness (see ref. 53 ) or frozen disorder in controlling CR’s transmission. The former should lead to appreciable deviations from Fresnel relations and the latter to a saturation of the phonon mean-free-path effect at low temperature, both of which are not observed.…”
Section: Resultsmentioning
confidence: 99%
“…This is why many groups choose to use metallic bottom gates to screen charge inhomogeneities. Graphite flakes are particularly popular for this purpose, due to their compatibility with the hBN-G-hBN heterostructures [80,[125][126][127][128]. However, graphite being a microwave absorber, it cannot be used in our high frequency devices.…”
Section: Nanofabrication Of Encapsulated Graphene Devicesmentioning
confidence: 99%
“…A recent experimental work by Zhou et al [128] points out the importance of minimizing the junction roughness in order to obtain well-defined interfaces for Dirac fermion optics experiments. They study the effective junction roughness of gate-induced p-n junctions using scanning tunneling microscopy.…”
Section: Remarks On the Junction Roughnessmentioning
confidence: 99%
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