2020
DOI: 10.1021/acs.chemmater.9b04967
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Atomic Layer Deposition of Localized Boron- and Hydrogen-Doped Aluminum Oxide Using Trimethyl Borate as a Dopant Precursor

Abstract: This is a self-archived version of an original article. This version may differ from the original in pagination and typographic details.

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Cited by 3 publications
(1 citation statement)
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“…Although ALD is regarded as a linear growth process in thin film deposition. Actually, the surface compositions of the substrate influence the ALD growth rates in the initial stage 37,38 . Surface LiOH and Li 2 CO 3 could induce the variation of the B 2 O 3 growth rates on the SC83 particles.…”
Section: Resultsmentioning
confidence: 99%
“…Although ALD is regarded as a linear growth process in thin film deposition. Actually, the surface compositions of the substrate influence the ALD growth rates in the initial stage 37,38 . Surface LiOH and Li 2 CO 3 could induce the variation of the B 2 O 3 growth rates on the SC83 particles.…”
Section: Resultsmentioning
confidence: 99%