DOI: 10.1115/1.4035574
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Abstract: Atomic force microscopy (AFM) is one of the most effective tools in nanotechnology researches. Using the raster scanning method with a soft cantilever, three dimensional sample surface topography can be obtained with a sub-nanometer resolution. In this study, AFM is employed to characterize the nanostructures of polymer film under two temperature treatments. 3-aminopropyltriethoxysilane (APTES) is selected as a model polymer molecule due to its wide applications for amino-functionalization of Si/SiOx based sur…

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