Argon ionization cross sections for charge state distribution modeling in electron cyclotron resonance ion source

Bogatu, I. N.; Edgell, D. H.; Kim, J. S.; Pardo, R. C.; Vondrasek, R.

doi:10.1063/1.1427030

Cited by 4 publications

(6 citation statements)

References 21 publications

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“…Comparing Figs. 22 and 21, we see that a ratio between currents in the high and low modes is well reproduced in the simulations. When tuning the source for production of moderately charged ions such as Ar 8+ , most efforts typically is put to increase the gas flow into the chamber without slipping into the low mode; when source is in the low mode, it is necessary to decrease the gas flow substantially to restore the source good performance.…”

Section: Dependencies On the Gas Flow And On The Coupled Microwave Powersupporting

confidence: 54%

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Numerical model of electron cyclotron resonance ion source

Mironov

Bogomolov

Bondarchenko

et al. 2015

Phys. Rev. ST Accel. Beams

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Important features of Electron Cyclotron Resonance Ion Source (ECRIS) operation are accurately reproduced with a numerical code. The code uses the particle-in-cell technique to model a dynamics of ions in ECRIS plasma. It is shown that gas dynamical ion confinement mechanism is sufficient to provide the ion production rates in ECRIS close to the experimentally observed values. Extracted ion currents are calculated and compared to the experiment for few sources. Changes in the extracted ion currents are obtained with varying the gas flow into the source chamber and the microwave power. Empirical scaling laws for ECRIS design are studied and the underlying physical effects are discussed PACS numbers: 29.25.Ni, 52.50.Dg

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Section: Dependencies On the Gas Flow And On The Coupled Microwave Powersupporting

confidence: 54%

“…The single ionization rates are combined from datasets [20,21]. Double ionization rates are taken from the fit of [22] after correcting for some mistypes in their table of fitting coefficients. For the ionization rates with a number of removed electrons n>=3 we use the scaling from [23].…”

Section:      mentioning

confidence: 99%

Numerical model of electron cyclotron resonance ion source

Mironov

Bogomolov

Bondarchenko

et al. 2015

Phys. Rev. ST Accel. Beams

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“…Multiple ionization could enhance the simple ionization cross sections significantly to affect charge distribution. 11 The numerical results presented here are far from complete. Plasma sheath regions and beam extraction diodes have not been taken into account in the MCBC code and the background plasma modeling GEM code.…”

Section: Discussionmentioning

confidence: 92%

Monte Carlo beam capture and charge breeding simulation

Kim¹,

Liu²,

Edgell

et al. 2006

Review of Scientific Instruments

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A full six-dimensional ͑6D͒ phase space Monte Carlo beam capture charge-breeding simulation code examines the beam capture processes of singly charged ion beams injected to an electron cyclotron resonance ͑ECR͒ charge breeder from entry to exit. The code traces injected beam ions in an ECR ion source ͑ECRIS͒ plasma including Coulomb collisions, ionization, and charge exchange. The background ECRIS plasma is modeled within the current frame work of the generalized ECR ion source model. A simple sample case of an oxygen background plasma with an injected Ar +1 ion beam produces lower charge breeding efficiencies than experimentally obtained. Possible reasons for discrepancies are discussed.

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“…10 Direct ionization, autoionization, and double ionization of Ar for all charge states are used in our simulation.…”

Section: Beam Capture Dynamics Modeling By Mcbcmentioning

confidence: 99%

“…The FokkerPlanck equation is solved to obtain the non-Maxwellian electron energy distribution function. 5,9,10 As electron temperature is not well defined, we use average electron energy density:…”

Section: Ecris Plasma Model and Parameter Study Using Gemmentioning

confidence: 99%

Electron cyclotron resonance charge breeder ion source simulation by MCBC and GEM

Kim

Zhao

Cluggish

et al. 2008

Review of Scientific Instruments

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Numerical simulation results by the GEM and MCBC codes are presented, along with a comparison with experiments for beam capture dynamics and parameter studies of charge state distribution (CSD) of electron cyclotron resonance charge breeder ion sources. First, steady state plasma profiles are presented by GEM with respect to key experimental parameters such as rf power and gas pressure. As rf power increases, electron density increases by a small amount and electron energy by a large amount. The central electrostatic potential dip also increased. Next, MCBC is used to trace injected beam ions to obtain beam capture profiles. Using the captured ion profiles, GEM obtains a CSD of beam ions. As backscattering can be significant, capturing the ions near the center of the device enhances the CSD. The effect of rf power on the beam CSD is mainly due to different steady states plasmas. Example cases are presented assuming that the beam ions are small enough not to affect the plasma.

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Argon ionization cross sections for charge state distribution modeling in electron cyclotron resonance ion source

Cited by 4 publications

References 21 publications

Numerical model of electron cyclotron resonance ion source

Numerical model of electron cyclotron resonance ion source

Monte Carlo beam capture and charge breeding simulation

Electron cyclotron resonance charge breeder ion source simulation by MCBC and GEM

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