2000
DOI: 10.1109/23.903774
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Application of hardness-by-design methodology to radiation-tolerant ASIC technologies

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Cited by 130 publications
(37 citation statements)
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“…However, these processes are typically two or three generations behind the commercial state-of-the-art. At the circuit level, there are a number of techniques that fall under the category of radiation-hardenedby-design (RHBD) (Alexander et al, 1996;Mavis and Alexander, 1997;Anelli et al, 1999;Lacoe et al, 2000). Special latches that are tolerant or immune to SEU have been developed using spatial redundancy because of the emphasis on sequential logic (Mavis and Eaton, 2002;Calin and Nicolaidis, 1996;Hazucha et al, 2003).…”
Section: Mitigation Techniquesmentioning
confidence: 99%
“…However, these processes are typically two or three generations behind the commercial state-of-the-art. At the circuit level, there are a number of techniques that fall under the category of radiation-hardenedby-design (RHBD) (Alexander et al, 1996;Mavis and Alexander, 1997;Anelli et al, 1999;Lacoe et al, 2000). Special latches that are tolerant or immune to SEU have been developed using spatial redundancy because of the emphasis on sequential logic (Mavis and Eaton, 2002;Calin and Nicolaidis, 1996;Hazucha et al, 2003).…”
Section: Mitigation Techniquesmentioning
confidence: 99%
“…While the use of "enclosed" transistors [6,7] was not implemented in this design, previous measurements of the threshold voltage shift in this deep submicron process was determined to be quite acceptable. It should also be noted that results presented during this symposium on leakage currents for deeper sub-micron processes indicate that the benefits of this technique may not be significant for processes below 0.13µm feature size.…”
Section: Radiation Hardnessmentioning
confidence: 99%
“…To eliminate the parasitic channels, the enclosed layout transistor (ELT) was introduced [5], [7]. In this geometry the gate completely surrounds the source of the transistor, avoiding any parasitic channels.…”
Section: Total Ionizing Dose Effects In Mos Devicesmentioning
confidence: 99%
“…To clearly demonstrate the effectiveness of the radiation tolerant layout approach [5], [7], the same bandgap reference circuit was designed using the standard linear layout MOS transistors all over the design except for the DTMOST's structures. The DTMOST's were in the enclosed layout transistor geometry.…”
Section: B Fluctuation Of the Reference Voltage Caused By X-ray Irramentioning
confidence: 99%
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