2012
DOI: 10.1016/j.sse.2011.11.023
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Analytical compact modeling framework for the 2D electrostatics in lightly doped double-gate MOSFETs

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Cited by 25 publications
(12 citation statements)
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“…(6) φ channel (x, y) and the band bending distances from eqn. (8) and (9). In the source region for −d s < x < 0 follows (10) and in the drain region for l ch < x < l ch + d d…”
Section: Source/drain Potential Extensionmentioning
confidence: 99%
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“…(6) φ channel (x, y) and the band bending distances from eqn. (8) and (9). In the source region for −d s < x < 0 follows (10) and in the drain region for l ch < x < l ch + d d…”
Section: Source/drain Potential Extensionmentioning
confidence: 99%
“…The main approach consists in a 2D closed-form Poisson equation solution φ P oisson within the channel area [8]. To consider parabolically shaped potential profiles at the source-and drain-to-channel junctions an additional 2D closed-form parabolic solution φ para from [9] was implemented for the channel region.…”
Section: Modeling Approachmentioning
confidence: 99%
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“…1, the assumed structure of the IV and III-V SB double-gate MOSFET device is shown with the definition of coordinates and boundary conditions. The structure in general has been reported in [28] and the adopted boundaries for the III-V channel material in [19] and [20]. The model presented in [19] and [20] was used to predict the n-type device behavior and was compared with TCAD Sentaurus FEM simulations [13].…”
Section: Approachmentioning
confidence: 99%