2008
DOI: 10.1063/1.3050345
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Analytical ballistic theory of carbon nanotube transistors: Experimental validation, device physics, parameter extraction, and performance projection

Abstract: We developed a fully analytical ballistic theory of carbon nanotube field effect transistors enabled by the development of an analytical surface potential capturing the temperature dependence and gate and quantum capacitance electrostatics. The analytical ballistic theory is compared to the experimental results of a ballistic transistor with good agreement. The validated analytical theory enables intuitive circuit design, provides techniques for parameter extraction of the bandgap and surface potential, and el… Show more

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Cited by 58 publications
(31 citation statements)
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“…This letter represents a practical approach that fills a gap of computational tools between analytic ballistic models [8] and full-band Monte Carlo simulations of diffusive transport [7].…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…This letter represents a practical approach that fills a gap of computational tools between analytic ballistic models [8] and full-band Monte Carlo simulations of diffusive transport [7].…”
Section: Discussionmentioning
confidence: 99%
“…Previous theoretical efforts have developed sophisticated multiband Boltzmann transport [6] and Monte Carlo [7] simulations of CNTs. However, while compact models have been introduced for ballistic conduction in S-CNTs [8], no such work exists for diffusive mobility calculations.…”
Section: Introductionmentioning
confidence: 99%
“…The diameter determines the conductivity of the channel region and modulates the threshold voltage of a CN-MOSFET [9]. The diameter thereby influences both on-state and off-state currents.…”
Section: A Carbon Nanotube Diametermentioning
confidence: 99%
“…The diameter thereby influences both on-state and off-state currents. The threshold voltage of a single-tube P-type CN-MOSFET is [9] …”
Section: A Carbon Nanotube Diametermentioning
confidence: 99%
“…Consequently, the trans‐conductance value of the CNTFET in subthreshold region that is considered as a relation between the output current ( I D ) and input voltage ( V GS ) is obtained as follows: gm,sth=IitalicsthVGSvds=0=1Rq()e2qVGSEg2italickT1+e2italicqVitalicGSEg2kTe2qVGS2normalαqVnormalDSEg2italickT1+e2italicqVitalicGS2αitalicqVitalicDSEg2kT …”
Section: Cntfet Technologymentioning
confidence: 99%