Structured Document Image Analysis 1992
DOI: 10.1007/978-3-642-77281-8_18
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Analysis of Technical Documents: The REDRAW System

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Cited by 34 publications
(16 citation statements)
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“…The problem of arc detection was recently studied in [77] proposing a method that combines two of the most reliable techniques in the literature. Hatched pattern detection is an important concern in the field of document analysis [78,69,73] and is usually solved by clustering parallel lines having the same slope angle and sorting them along a normal direction. Dimensions usually follow strict standards.…”
Section: Engineering Drawingsmentioning
confidence: 99%
See 1 more Smart Citation
“…The problem of arc detection was recently studied in [77] proposing a method that combines two of the most reliable techniques in the literature. Hatched pattern detection is an important concern in the field of document analysis [78,69,73] and is usually solved by clustering parallel lines having the same slope angle and sorting them along a normal direction. Dimensions usually follow strict standards.…”
Section: Engineering Drawingsmentioning
confidence: 99%
“…From a general point of view, we could define three types of maps which have their own notational conventions. At the lowest level of difficulty, we could place cadastral city maps [69,55,79,70]. In such type of documents, symbols have a polygonal shape often filled by a hatching pattern.…”
Section: Mapsmentioning
confidence: 99%
“…-Cadastral maps with the Redraw system [13]. In this early work, contextual knowledge about the city maps we wanted to analyze was embedded in the recognition process, through simple heuristics on the kinds of features we were interested in: hatched areas representing buildings, closed areas with labels corresponding to land parcels, streets, etc.…”
Section: Recognitionmentioning
confidence: 99%
“…Tracking and matching opposite contours is an alternative technique that was tested in the late 80's [1], [36]. It provides correct and accurate results if the junctions are simple.…”
Section: A Finding the Lines: Raster-to-vector Conversionmentioning
confidence: 99%