2003
DOI: 10.1016/s0030-3992(02)00122-6
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Analysis of CCD moiré pattern for micro-range measurements using the wavelet transform

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Cited by 29 publications
(27 citation statements)
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“…The thickness of the overcoating layer was 1.3 μm, so the RM molecules were aligned well by the geometric alignment effect of the nanogroove structure, without any additional alignment method. A fringe pattern caused by the moiré effect can be formed by superposition of periodic structures [19,20]. In our case, because of the nanogroove structure the fringe pattern can be observed, as shown in Fig.…”
Section: Fabrication Of the Rm Lens Arraymentioning
confidence: 51%
See 1 more Smart Citation
“…The thickness of the overcoating layer was 1.3 μm, so the RM molecules were aligned well by the geometric alignment effect of the nanogroove structure, without any additional alignment method. A fringe pattern caused by the moiré effect can be formed by superposition of periodic structures [19,20]. In our case, because of the nanogroove structure the fringe pattern can be observed, as shown in Fig.…”
Section: Fabrication Of the Rm Lens Arraymentioning
confidence: 51%
“…In addition, we realize an RM lens that has a high fill factor because the edge region of the RM lens can be aligned well by top-down alignment. In this case, because of diffraction and moiré fringes caused by the remaining nanogroove structure on top of the RM layer, the imaging quality can be diminished [19,20]. However, in our approach, by overcoating the same RM on the surface of the thick planoconvex RM layer, the polarization-dependent RM lens array can be planarized, providing an almost ideal lens profile.…”
Section: Introductionmentioning
confidence: 96%
“…2a shows the resulting 1-D image intensity profile. Notice that the extracted period p m of the Moiré fringe pattern can be easily obtained as there are no specimen line grating artifacts, as observed with the 300 lpi line gratings used in (Chang, 2003 …”
Section: Near Similar Pitch Gratingsmentioning
confidence: 98%
“…The interaction between the two 'gratings' results in the formation of Moiré patterns, which can be simply captured by the CCD camera itself. This imaging device-based approach of using Moiré fringes for surface displacement measurement was suggested by (Chang, 2003), where they demonstrated how wavelet transform (WT) could be used to extract the pitch of the Moiré fringes for micro-range measurement. A micro-pitch grating of 300 lines per inch (lpi) was employed as the specimen grating so that the pitch dimensions of the grating is close to that of the CCD cell spacing.…”
Section: Introductionmentioning
confidence: 99%
“…5,6 The Moire method has a particularly unique advantage in that it can significantly improve the precision with no further demands on the sensitivity of the optical sensor. For this reason, the Moire method is widely used for optical displacement measurements in optical encoders 2,7,8 and curved surface metrology. [9][10][11][12] We attempt here to implement Moire technologies into ORMS in order to improve the measurement precision.…”
Section: Introductionmentioning
confidence: 99%