2016
DOI: 10.1109/ted.2016.2569488
|View full text |Cite
|
Sign up to set email alerts
|

Analysis and Performance Study of III–V Schottky Barrier Double-Gate MOSFETs Using a 2-D Analytical Model

Abstract: A comprehensive study and comparison of IV and III-V Schottky barrier (SB) double-gate MOSFETs using a universal analytical model and Synopsys TCAD Sentaurus is presented. Various impacts on the device performance have been identified, e.g., the SB height, the bandgap, the materialdependent carrier masses, and density-of-states affecting the ambipolar behavior and ON-current. The performance is analyzed with respect to the most important physical parameters and their impact on the device figure of merit. Ambip… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
5
0

Year Published

2017
2017
2023
2023

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 14 publications
(5 citation statements)
references
References 31 publications
0
5
0
Order By: Relevance
“…A series of physical effects could affect the behavior of real Schottky diodes, which include interfacial disorder, interface state densities, and extra tunneling effect. [17,18] To further explore the influence of this issue on C-V characteristics, a deeper understanding of the carrier transport mechanism is required. Therefore, we simulated the diode characteristics with the TCAD simulation tools, where a drift-diffusion equation set coupled with the Poisson equation is solved.…”
Section: Description Of the Simulation Processmentioning
confidence: 99%
“…A series of physical effects could affect the behavior of real Schottky diodes, which include interfacial disorder, interface state densities, and extra tunneling effect. [17,18] To further explore the influence of this issue on C-V characteristics, a deeper understanding of the carrier transport mechanism is required. Therefore, we simulated the diode characteristics with the TCAD simulation tools, where a drift-diffusion equation set coupled with the Poisson equation is solved.…”
Section: Description Of the Simulation Processmentioning
confidence: 99%
“…The electrical simulations described in this paper are performed using Sentaurus TCAD tools. [11] The simulations with metal-interfacial layer-semiconductor (MIS) model which is shown in Fig. 3 are based on the literature in Refs.…”
Section: Fabrication and Simulationmentioning
confidence: 99%
“…The electrical simulations of the metal-interfacesemiconductor (MIS) model [22] which is described in this paper are performed using the Sentaurus TCAD tool. [23] The model is based on the basic drift-diffusion and Poisson equations for direct current (DC), breakdown characteristics, and small-signal simulation. This basic drift-diffusion model includes the Fermi statistics, mobility with doping dependence and high-velocity saturation model, carrier generation, recombination, non-local tunneling, and band to band tunneling.…”
Section: Introductionmentioning
confidence: 99%