An X-ray imaging detector based on pixel structured scintillator

Kim, Byoung-Jik; Cho, Gyuseong; Kyung, Bo; Kang, Bo Sun

doi:10.1016/j.radmeas.2007.05.055

Cited by 16 publications

(10 citation statements)

References 12 publications

(10 reference statements)

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“…The spatial resolution of the sample which shows the smallest column size ( m) reaches lp/mm at 10% MTF. That of the reported pixelated CsI(Tl) scintillator film with the same thickness (the pixel size was m and the average column size was m) was lp/mm at 10% MTF [12]. The CsI(Tl) films with columnar-matrix structure show better spatial resolution.…”

Section: B Performances Of the Csi(tl) Filmsmentioning

confidence: 90%

Fabrication and Performance of CsI(Tl) Scintillation Films With Pixel-Like Columnar-Matrix Structure

Yao

Liu

et al. 2015

IEEE Trans. Nucl. Sci.

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In the recent decade, pixelated CsI(Tl) scintillation films are developed for X-ray imaging to improve spatial resolution. Several methods have been reported but better performance is still required. In this work, CsI(Tl) films were prepared on specially designed patterned substrates with regular arrays of pits. Each CsI(Tl) micro-column locates in one pit. In this way, CsI(Tl) films with pixel-like columnar-matrix structure were achieved. Each pixel contains one micro-column and the size of pixel is the average diameter of the columns. Morphologies of the films were examined by scanning electron microscopy. Imaging performances of films dependent on their structure are discussed. The prepared CsI(Tl) films show superior image performance and may be well-coupled with pixelated photo sensors for X-ray imaging systems.

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Section: B Performances Of the Csi(tl) Filmsmentioning

confidence: 90%

Fabrication and Performance of CsI(Tl) Scintillation Films With Pixel-Like Columnar-Matrix Structure

Yao

Liu

et al. 2015

IEEE Trans. Nucl. Sci.

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“…As shown in Ref. 11, a 1 mm-thick plumbum plate with shield was placed between the X-ray source and the scintillation film as the edge. A scanner (MICROTEK Phantom h9plus) which consisted of 4800×2400 dpi was used to scan the photographic film.…”

Section: Spatial Resolution Measurementsmentioning

confidence: 99%

“…Pixelated scintillators can be prepared to improve performances of scintillator with many techniques, for instance, cutting film or crystal with laser beam [5][6], melting scintillator powder into the pores formed with silicon [7][8], and depositing films in a special patterning substrate. However, only the pixelated films deposited in patterning substrate can keep its high light yield and be fabricated in a very small pixel pitch [9][10][11]. In this work, we successfully fabricated CsI:Tl film on a net-like substrate which was made from SU-8 photoresist.…”

Section: Introductionmentioning

confidence: 99%

A high spatial resolution CsI:Tl scintillation film based on net-like substrate

Zhang

Yao

et al. 2010

Seventh International Conference on Thin Film Physics and Applications

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CsI:Tl scintillation films were prepared on the net-like patterning substrates. The pattern of the substrates as well as the morphology of the CsI:Tl films were measured by SEM. The results show that the size of each grid on substrate is 55μm which is formed by SU-8 photoresist with 5μm in both height and width, and the CsI:Tl films display quite a good columnar structure. The spatial resolutions of X-ray imaging were taken by MTF measurement. The spatial frequency of the CsI:Tl films on patterned substrates can reach up to 10 lp/mm at the 10% level of MTF, which is twice higher than that of the CsI:Tl film on the substrate without patterning.

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“…synchrotron-based protein crystallography (PX)) and non-destructive evaluation, are based on the fact that the radiation hardness of CsI are retained at acceptable levels after the absorption of radiation doses up to a few hundred rads (Beylin et al, 2005;Labanti et al, 2008;Tsuji et al, 2010;Kocak et al, 2011;Woo and Kim, 2012). The most important feature of CsI:Tl scintillators is their ability to grow in columnar structure (Kim et al, 2007). This reduces the lateral light spread and promotes the directional light passing due to the internal reflection on column boundaries (Ananenko et al, 2004;Zhao et al, 2004;Kilimchuk et al, 2010;Fedorov et al, 2013).…”

Section: Introductionmentioning

confidence: 99%