IN THE CALCULATION of the radiation induced soft error rate (SER) for a given circuit, two separate problems arise. The first is the calculation of charge collection in the circuit nodes after a single radiation event. A Monte Carlo calculation accomplishing this task has already been published'. The determination of a charge collection pattern, however, by itself is not sufficient to predict a SER. Each hit leads t o a different pattern, depending on the point of impact, on the direction of particle propagat…
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