2004
DOI: 10.1016/s0955-2219(03)00377-7
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Ageing behavior of electrical resistance in manganite NTC ceramics

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Cited by 34 publications
(26 citation statements)
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“…It is known that conductive material penetrating spinel ceramics reduces electrical resistivity, thus resulting in negative RRD for such thick-film systems [10,11]. This diffusive-related process is strongly thermally-activated, in contrast to own structural changes occurring in ceramics body, which produces rather positive feedback in the RRD due to increased defectiveness of spinel matrix [14]. The negative RRD quickly saturates with conductive material penetrating into ceramics as it character for thick films of Cu 0.1 Ni 0.1 Co 1.6 Mn 1.2 O 4 spinel supplied by conductive Ag-Pd alloy contacts.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…It is known that conductive material penetrating spinel ceramics reduces electrical resistivity, thus resulting in negative RRD for such thick-film systems [10,11]. This diffusive-related process is strongly thermally-activated, in contrast to own structural changes occurring in ceramics body, which produces rather positive feedback in the RRD due to increased defectiveness of spinel matrix [14]. The negative RRD quickly saturates with conductive material penetrating into ceramics as it character for thick films of Cu 0.1 Ni 0.1 Co 1.6 Mn 1.2 O 4 spinel supplied by conductive Ag-Pd alloy contacts.…”
Section: Resultsmentioning
confidence: 99%
“…The starting ceramics were synthesized by sintering route (1040 o C, 4 h duration) using reagent grade Cu carbonate hydroxide, and Ni, Co, Mn carbonate hydroxide hydrates [12][13][14]. The paste was prepared by mixing powder of basic Cu 0.1 Ni 0.1 Co 1.6 Mn 1.2 O 4 ceramics with МБ-60 glass, Bi 2 O 3 (used as inorganic binder) and some organic vehicle.…”
Section: Nanoinhomogeneous Ceramics Preparationmentioning
confidence: 99%
“…To meet this high demand, the thermistor specification should be modified with more emphasis on the reliability of the composition. The aging coefficient of the NTC thermistors is characterized by the relative variation (R − R 0 )/R 0 × 100 %, in which R 0 is the resistance value at 20 K before aging, and R is the resistance value at 20 K after aging [8,[17][18][19][20]. The aging coefficient shows the long-term reliability of NTC thermistors.…”
Section: Aging Of Thermistorsmentioning
confidence: 99%
“…]/ [Mn 4? ] ions in the octahedral sites [7], resulting in cationic migrations and electronic changes between the sublattices of the spinel structure [8,9]. It was necessary to investigate the nature of their semiconductivity and the influence of impurities/dopants and heat treatments on their electrical characteristics, particularly aging.…”
Section: Introductionmentioning
confidence: 99%