KEM 2009 DOI: 10.4028/www.scientific.net/kem.409.113 View full text
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José M. López-Cepero, Sheldon M. Wiederhorn, António Ramirez de Arellano-López, Julian Martínez-Fernández

Abstract: Rhombohedral r-plane fracture surfaces in sapphire are analyzed by optical microscopy and by atomic force microscopy. Features of special interest include steps, lines and angles on the surface that appear to have crystallographic origins. A classification and description of these features is given over a scale ranging from hundreds of micrometers to tens of nanometers. Preferential directions in the surface are identified and related to the crystalline orientation of the sample; an attempt is made to identify…

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