2013
DOI: 10.1016/j.msec.2013.01.006
|View full text |Cite
|
Sign up to set email alerts
|

AFM imaging and analysis of local mechanical properties for detection of surface pattern of functional groups

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
19
0
1

Year Published

2014
2014
2021
2021

Publication Types

Select...
7

Relationship

3
4

Authors

Journals

citations
Cited by 25 publications
(20 citation statements)
references
References 18 publications
0
19
0
1
Order By: Relevance
“…An Atomic Force Microscope (AFM, Solver Pro M, NT-MDT) was used to evaluate the surface topography of the substrates in semi-contact mode following the second anodization, on the area of 5x5 µm 2 , according to conditions mentioned elsewhere [34]. The roughness (root mean square -RMS) of the surface of Ti substrates was monitored by a digital holographic microscope (DHM, DHMR1000, Lyncée Tec) from a representative area 5 415x415 µm 2 [35].…”
Section: Methodsmentioning
confidence: 99%
“…An Atomic Force Microscope (AFM, Solver Pro M, NT-MDT) was used to evaluate the surface topography of the substrates in semi-contact mode following the second anodization, on the area of 5x5 µm 2 , according to conditions mentioned elsewhere [34]. The roughness (root mean square -RMS) of the surface of Ti substrates was monitored by a digital holographic microscope (DHM, DHMR1000, Lyncée Tec) from a representative area 5 415x415 µm 2 [35].…”
Section: Methodsmentioning
confidence: 99%
“…The mechanical behaviour and thickness of the water layer on the surface of the naked/HA-coated Dynabeads M-270 Amine particles were analysed in force-spectroscopy mode [28,29]. The stiffness expressed by the slope of curves (Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The topography and force spectroscopy modes of the AFM were executed using the Solver Pro M instrument (NT-MDT, St. Peterburg, Russia). Data for diameter, topography and force spectroscopy were determined according to procedures described previously [27][28][29].…”
Section: Sem and Afm Measurementmentioning
confidence: 99%
“…This technique offered an efficient and non-destructive quantitative estimation of the topography, elasticity, viscoelasticity, and stiffness from the upper part of the individual fibre (25). The comparison of the mechanical behaviour was based on the determination of the linear part of the retractive force of the tip during indentation of the material proportional to the nanoindentation stiffness/hardness (18,26). Thin fibres (below 100 nm) could be stiffer as the measurement is influenced by the substrate during indentation or swelling by the air humidity.…”
Section: Discussionmentioning
confidence: 99%