A PUF scheme using competing oxide rupture with bit error rate approaching zero

Wu, Meng-Yi; Yang, Tsao-Hsin; Chen, Lun-Chun; Lin, Chi‐Chang; Hu, Hao-Chun; Su, Fang-Ying; Wang, Chih‐Min; Huang, James Po-Hao; Chen, Hsin‐Ming; Lu, Chris Chun-Hung; Yang, Evans Ching-Sung; Shen, Rick Shih-Jye

doi:10.1109/isscc.2018.8310218

Cited by 68 publications

(32 citation statements)

References 3 publications

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“…-Optical PUF [20], -Coating PUF [28], -SRAM PUF [9], -Glitch PUF [27], -Arbiter PUF [19,6], -Loop PUF [4], -Memory contention PUF [8], -Oxide rupture PUF [29], -Transistor voltage threshold [26].…”

Section: Towards a Standard Related To Pufsmentioning

confidence: 99%

“…However, some PUFs are prepared by the foundry, but must be "revealed" later on (like a photographic picture after exposition). For example, the oxide rupture PUF [29] is not operational right after fabrication, but becomes operational subsequent to some locking process. Besides, some PUFs are not steady by nature, and for them to be of practical use, their overall steadiness must be improved by removing those entropy sources which are the less steady.…”

Section: Puf Life-cyclementioning

confidence: 99%

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Development of the Unified Security Requirements of PUFs During the Standardization Process

Bruneau

Danger

Facon

et al. 2019

Innovative Security Solutions for Information Technology and Communications

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This paper accounts for some scientific aspects related to the international standardization process about physically unclonable functions (PUFs), through the drafting of ISO/IEC 20897 project. The primary motivation for this standard project is to structure and expand the market of PUFs, as solutions for non-tamperable electronic chips identifiers. While drafting the documents and discussing with international experts, the topic of PUF also gained much maturity. This article accounts how scientific structuration of the PUF as a field of embedded systems security has been emerging as a byproduct. First, the standardization has allowed to merge two redundant security requirements (namely diffuseness and unpredictability) into one (namely randomness), which in addition better suits all kinds of PUFs. As another contribution, the standardization process made it possible to match unambiguous and consistent tests with the security requirements. Furthermore, the process revealed that tests can be seen as estimators from their theoretic expressions, the so-called stochastic models.

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Section: Towards a Standard Related To Pufsmentioning

confidence: 99%

Section: Puf Life-cyclementioning

confidence: 99%

Development of the Unified Security Requirements of PUFs During the Standardization Process

Bruneau

Danger

Facon

et al. 2019

Innovative Security Solutions for Information Technology and Communications

View full text Add to dashboard Cite

show abstract

“…In recent PUF works [2]- [7], the stability is considered as a major concern, since it usually takes more resource to be optimized. On the other hand, a PUF with an excellent native stability, i.e.…”

Section: A Stability Of Pufmentioning

confidence: 99%

“…The bit stability in such case is usually good but is out of scope for this work, since it is linked to the specific device physics. The other approach is based on aging effects that can be electrically induced, such as biasedtemperature instability (BTI) [3], hot-carrier injection (HCI) [4] and oxide breakdown (BD) [5]- [7]. In this paper, we will focus on the stability aspects of our proposed PUF using soft oxide breakdown (SBD), namely soft-BD PUF, with detailed experiments on the chips fabricated in 40nm.…”

Section: B Approaches Towards Ideal Stabilitymentioning

confidence: 99%

A Physically Unclonable Function with 0% BER Using Soft Oxide Breakdown in 40nm CMOS

Bury

Degraeve

Kaczer

et al. 2018

2018 IEEE Asian Solid-State Circuits Conference (A-Sscc)

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A physically unclonable function (PUF) utilizing the randomness of soft oxide breakdown (BD) locations in MOSFETs is presented. The so-called soft-BD PUF features a self-limiting mechanism to generate one single soft-BD spot in a pair of MOSFETs; the subsequent BD location is used as the source of entropy to generate a highly stable "0" or "1" bit with an equal probability of 0.5. The soft-BD PUF comprising all the essential periphery circuits are fabricated in a 40nm CMOS process. Experiments show that the PUF has no instability in most of the operating conditions using the proposed readout scheme. The native bit error rate remains zero from VDD=0.8V to 1.5V at room temperature and from-20°C to 120°C at nominal VDD=0.9V. The throughput is shown to be at least 40 Mb/s and the PUF readout consumes only 51.8 fJ/bit. The randomness and uniqueness of the PUF are close to an ideal case, and no spatial correlation was observed.

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“…This event appears the first time the two RRAMs are brought in competition, after which it becomes repetitive. The idea of competing elements for the generation of unpredictable bits has also been proposed with AF gates [17]. The association of RRAMs has already been exploited for hardware security applications [18]- [21].…”

Section: Introductionmentioning

confidence: 99%