1994
DOI: 10.1063/1.1144691
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A PC-based system for studying current-controlled electrical switching in solids

Abstract: A simple PC-based system has been developed for studying the current-controlled electrical switching in solids, in particular amorphous semiconductors. The system has provisions for investigating the switching behavior in the continuous current mode or in the pulse mode and for resetting memory-switched samples. It also has facilities for studying the switching behavior under controlled heating.

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Cited by 24 publications
(12 citation statements)
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“…The threshold voltage is found to decrease with increase of temperature. The observed variation of threshold voltage is similar to those reported in the literature (Mansingh and Dhawan 1983;Chatterjee et al 1994). The thickness dependence of I-V characteristics has been carried out and figure 3 shows the variation of V th with sample thickness.…”
Section: Resultssupporting
confidence: 74%
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“…The threshold voltage is found to decrease with increase of temperature. The observed variation of threshold voltage is similar to those reported in the literature (Mansingh and Dhawan 1983;Chatterjee et al 1994). The thickness dependence of I-V characteristics has been carried out and figure 3 shows the variation of V th with sample thickness.…”
Section: Resultssupporting
confidence: 74%
“…It is clear from the I-V cycles that, after reaching V th an irreversible state having conductivity level more than 6 orders of magnitude higher is obtained. In samples exhibiting current controlled negative resistance (CCNR) behaviour with memory, once set, the low resistance state is retained (Chatterjee et al 1994). Any subsequent I-V cycles exhibit only the high conducting region, CA.…”
Section: Resultsmentioning
confidence: 99%
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“…The current through the sample is varied from 0-2 mA in a programmed manner and the I-V characteristics are obtained. The experimental arrangement is described in detail elsewhere [18]. DSC studies have been performed to evaluate the thermal parameters of these glasses.…”
Section: Methodsmentioning
confidence: 99%
“…Electrical switching studies were carried out using a Keithley Sourcemeter (Model: 2410C) interfaced with a PC controlled by Lab VIEW 8.5 (National Instruments, Austin, TX) [30]. Sample polished to a thickness of 0.30 mm was placed between a point contact top electrode and a flat plate bottom electrode using a spring loading mechanism.…”
Section: Methodsmentioning
confidence: 99%