A Novel TPG Method for Reducing BIST Test-Vector Size

Zhang, Jinyi; Li, Jiao

doi:10.1109/hdp.2007.4283639

Cited by 2 publications

(15 citation statements)

References 8 publications

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“…Hence, the weighted patterns can also be generated with the maximum length, as shown in equation 1. the conventional TPGs [5] update the next (i+1)-th state as…”

Section: Proposed Low-power Weighted Pseudorandom Tpg Using the mentioning

confidence: 99%

“…, equation 4is applied as a weighted generator. The conventional TPGs [5] require '2 m -1' binary additions due to the primitive polynomial Y [ ].…”

Section: =0mentioning

confidence: 99%

“…Here, the proposed TPG requires only 'm' binary additions and one selection, as shown in equation (4). WE is the estimated weight to be obtained at the ( +1)-th clock cycle, and k denotes the total number of clocks in equation (5). WE assign random weights in the range of '0' to 'k' using the clock delay of the D flipflop.…”

Section: =0mentioning

confidence: 99%

“…Although WA generates both even and odd parities, the additional WE bits are continuously defined for accurate weights in the TPG output. This is represented as WE [ + 1] in equation (5) and can be accomplished in the weight generator using the weight enable signal and the tapped convolution values of the cascaded register function. According to the weights WA and WE using additional hardware, eight iterations can occur during the duration of the (i+j)-th clock cycle.…”

Section: Figure 5 Flowchart Of the Proposed Weighted Pseudorandom Tpmentioning

confidence: 99%

“…For clock cycles from 300 to 2,000, the 30% activated scan chains achieve more fault coverage than the 100% activated scan chains at 200 cycles. Since [5] is the standard TPG, it cannot be implemented by the most recent BIST models, taking into account the higher delay and lower throughput. Additionally, the weighted patterns cannot be generated by [5]; it is not well suited for the BIST [21], [22] designs.…”

Section: Application Of Proposed Weighted Tpg In Test-per-scan Bimentioning

confidence: 99%

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A Low-Power and Area-Efficient Design of a Weighted Pseudorandom Test-Pattern Generator for a Test-Per-Scan Built-in Self-Test Architecture

2021

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A test pattern generator generates a pseudorandom test pattern that can be weighted to reduce the fault coverage in a built-in self-test. The objective of this paper is to propose a new weighted TPG for a scan-based BIST architecture. The motivation of this work is to generate efficient weighted patterns for enabling scan chains with reduced power consumption and area. Additionally, the pseudo-primary seed of TPG is maximized to obtain a considerable length in the weighted pseudorandom patterns. The maximum-length weighted patterns are executed by assigning separate weights to the specific scan chains using a weight-enabled clock. This approach reduces the hardware overhead and achieves a low power consumption of 26.7 nW. Moreover, the proposed weighted TPG is applied in two different test-per-scan BIST architectures and achieves accurate results. The weighted patterns are also generated with fewer switching transitions and higher fault coverages of 98.81% and 97.35% in two different BIST architectures. This process is observed with six other circuits under test as their scan chains. The simulation results are tested with a SilTerra 0.13 µm process on the Mentor Graphics IC design platform. Furthermore, the proposed weighted TPG is enlarged to a higher bit TPG, which is compared to accomplish the performance strategies. The experimental results of the proposed TPG design are compared and tabulated with existing potential TPG designs. INDEX TERMS built-in self-test (BIST), circuit under test (CUT), test-pattern generator (TPG).

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“…Hence, the weighted patterns can also be generated with the maximum length, as shown in equation 1. the conventional TPGs [5] update the next (i+1)-th state as…”

Section: Proposed Low-power Weighted Pseudorandom Tpg Using the mentioning

confidence: 99%

“…, equation 4is applied as a weighted generator. The conventional TPGs [5] require '2 m -1' binary additions due to the primitive polynomial Y [ ].…”

Section: =0mentioning

confidence: 99%