DOI: 10.1109/date.2004.1268855
View full text
|
|
Share

Abstract: Abstract-This paper presents a new method of adapting body biasing on a chip during post-fabrication testing in order to mitigate the effects of process variations. Individual well biasing voltages can be changed to be connected either to a chip wide well bias or to a different bias voltage through a self-regulating mechanism, allowing biasing voltage adjustments on a per well basis. The scheme requires only one bias voltage distribution network, but allows for back biasing adjustments to more effectively mit…

expand abstract