2008 IEEE International Electron Devices Meeting 2008
DOI: 10.1109/iedm.2008.4796822
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A highly punchthrough-immune operation method for an ultra-short-channel hot-carrier-injection type non-volatile memory cell

Wen-Jer Tsai
1
,
T.F. Ou
2
,
Jen-Wei Huang
3
et al.
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