2010 2nd International Conference on Information Technology Convergence and Services 2010
DOI: 10.1109/itcs.2010.5581280
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Cited by 2 publications
(1 citation statement)
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“…The method that aims to minimize switching activity in the scan chain through re-ordering the scan cells in the scan chain is proposed in [12][13][14][15][16][17][18]. In [18], a weighted graph comprised of scan cells as the graph vertices and the number of transitions between two adjacent cells for a specific sequence of test patterns as the edges of graph was introduced.…”
Section: Overview Of Hardware-based Test Power Reduction Approachesmentioning
confidence: 99%
“…The method that aims to minimize switching activity in the scan chain through re-ordering the scan cells in the scan chain is proposed in [12][13][14][15][16][17][18]. In [18], a weighted graph comprised of scan cells as the graph vertices and the number of transitions between two adjacent cells for a specific sequence of test patterns as the edges of graph was introduced.…”
Section: Overview Of Hardware-based Test Power Reduction Approachesmentioning
confidence: 99%