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Cited by 17 publications
(6 citation statements)
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“…7(a)) is large enough for reliability warranty, as compared with our estimation of signal reliability degradation of mV [5] due to data retention after imprint and fatigue inherent to 90 nm-film-thickness MOCVD-PZT material. Furthermore, the introduction of ECC in a 64 Mb chip [7] relieves fail bits due to unexpected reliability degradation.…”
Section: B Measured Vdc and Cell Signal Window Improvementmentioning
confidence: 99%
See 2 more Smart Citations
“…7(a)) is large enough for reliability warranty, as compared with our estimation of signal reliability degradation of mV [5] due to data retention after imprint and fatigue inherent to 90 nm-film-thickness MOCVD-PZT material. Furthermore, the introduction of ECC in a 64 Mb chip [7] relieves fail bits due to unexpected reliability degradation.…”
Section: B Measured Vdc and Cell Signal Window Improvementmentioning
confidence: 99%
“…Fig. 1(b) shows the measured cell signal distributions of all "1" and "0" data of 64 Mb chain FeRAM chip [7] at array operating voltage VAA of 1.8 V. The x-axis shows the reference bitline bias VrefBL. The y-axis shows the number of cumulative fail bits.…”
Section: Introductionmentioning
confidence: 99%
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“…Recent advances in Non-Volatile Memory (NVM) [3,23,7] technologies such as flash memory [3,7], Phase Change Memory (PCM), Spin-Transfer Torque Random Access Memory (STT-RAM) [15,24,14], and Ferroelectric Random Access Memory (FeRAM) [18,8] have attracted great research interests due to their promising features. These features include high density, power-economy, low-cost, non-volatility properties, high immunity to soft errors, etc.…”
Section: Background and Related Workmentioning
confidence: 99%
“…Recent advances in Non-Volatile Memory (NVM) technologies such as flash memory [7,12], Phase Change Memory (PCM), STT-RAM [23,35,20], and FeRAM [27,13] have attracted a lot of research interests. These NVMs offer high density, power-economy, low-cost, non-volatility properties, and high immunity to soft errors.…”
Section: Related Workmentioning
confidence: 99%