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Cited by 3 publications
(4 citation statements)
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“…Figure 7 (a) summarizes these techniques and achievements. For example, hierarchical SA scheme with offset cancellation [9] and divided WL scheme with WL repeaters and distributed WL voltage (VWL) drivers [10] effectively shorten the random read access time. VWL temperature compensation [11] and dual rail WL driver can mitigate the voltage stress to the gate oxide of WL drivers/repeaters and guarantee time dependent dielectric breakdown (TDDB) lifetime.…”
Section: Random Read Performance Enhancementmentioning
confidence: 99%
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“…Figure 7 (a) summarizes these techniques and achievements. For example, hierarchical SA scheme with offset cancellation [9] and divided WL scheme with WL repeaters and distributed WL voltage (VWL) drivers [10] effectively shorten the random read access time. VWL temperature compensation [11] and dual rail WL driver can mitigate the voltage stress to the gate oxide of WL drivers/repeaters and guarantee time dependent dielectric breakdown (TDDB) lifetime.…”
Section: Random Read Performance Enhancementmentioning
confidence: 99%
“…For example, in-field software update by OTA in connected car era requires more careful eFlash design to reduce noise caused by charge pump operations from the viewpoints of EMI (electromagnetic interference) and power integrity. Variable program current (VPC) scheme [10] was proposed to reduce power line noise during program operations. Program current and the number of simultaneously programmed cells are flexibly changed halfway in the sequence and the total current consumption can be suppressed.…”
Section: Adaptive Program/erase (P/e) Controlmentioning
confidence: 99%
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