71k4 - 78h10

Every, A. G.; McCurdy, A. K.

doi:10.1007/10046537_84

Second and Higher Order Elastic Constants

DOI: 10.1007/10046537_84

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71k4 - 78h10

A. G. Every¹,

A. K. McCurdy²

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Shot-Noise-Limited Nanomechanical Detection and Radiation Pressure Backaction from an Electron Beam

et al. 2019

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Detecting nanomechanical motion has become an important challenge in Science and Technology. Recently, electromechanical coupling to focused electron beams has emerged as a promising method adapted to ultra-low scale systems. However the fundamental measurement processes associated with such complex interaction remain to be explored. Here we report highly sensitive detection of the Brownian motion of µm-long semiconducting nanowires (InAs). The measurement imprecision is found to be set by the shot noise of the secondary electrons generated along the electromechanical interaction. By carefully analysing the nano-electromechanical dynamics, we demonstrate the existence of a radial backaction process which we identify as originating from the momentum exchange between the electron beam and the nanomechanical device, which is also known as radiation pressure.

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Shot-Noise-Limited Nanomechanical Detection and Radiation Pressure Backaction from an Electron Beam

et al. 2019

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71k4 - 78h10

Cited by 1 publication

References 439 publications

Shot-Noise-Limited Nanomechanical Detection and Radiation Pressure Backaction from an Electron Beam

Shot-Noise-Limited Nanomechanical Detection and Radiation Pressure Backaction from an Electron Beam

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