3D High-resolution Mapping of Polarization Profiles in Thin Poly(vinylidenefluoride-trifluoroethylene) (PVDF-TrFE) Films Using Two Thermal Techniques

Polarization imaging in ferroelectric polymer thin film capacitors by pyroelectric scanning microscopy

“…[29][30][31][32] Moreover, 3D polarization information can be obtained from crystals and thick films by combining 2D laser scanning with depth profiles obtained using either pulse time-of-flight methods, 33 or Laser Intensity Modulation Method (LIMM), [34][35][36][37][38] or both. 39 One key advantage of PSM over techniques based on atomic force microscopy (AFM) is that the optical probe is noninvasive and does not damage or alter the sample. 40 The PSM technique, however, can only determine the component of the polarization perpendicular to the electrodes, whereas vector PFM can obtain both in-plane and out-of-plane components.…”

“…41 In addition, PFM affords higher spatial resolution, down to 10 nm, 42 whereas prior PSM studies have only achieved a spatial resolution of 2 lm. 14,39 Optimizing the resolution of PFM requires careful attention to both optical and thermal limitations in conjunction with a 3D thermal model. [34][35][36]43 With these considerations in mind, we have designed a PSM system with much improved resolution by using a violet laser and high f-number microscope objective to reduce the optical spot size, and by operating at high modulation frequencies to reduce the thermal diffusion length.…”

Contributed Review: Review of thermal methods for space charge measurement

“…13, 14, and 17-21, but the comparison of some techniques is reported in Refs. [22][23][24][25]. In a recent review article Singh 21 also reports the main causes of error encountered in these methods.…”

Characterisation of the polarisation state of embedded piezoelectric transducers by thermal waves and thermal pulses

“…The advantage of the thermal pulse method is a higher pyroelectric signal in a shorter measuring time. In Pham et al (2009) both methods are used to map the polarisation profiles in thin dielectric films with a high resolution. Pham et al (2009) came to the conclusion that they provide similar results with the thermal pulse method being up to 50 times faster.…”

“…In Pham et al (2009) both methods are used to map the polarisation profiles in thin dielectric films with a high resolution. Pham et al (2009) came to the conclusion that they provide similar results with the thermal pulse method being up to 50 times faster. The use of scanning LIMM to generate a polarisation map of the sample surface is described in more detail by Stewart and Cain (2009).…”