2019
DOI: 10.1007/s00603-019-01977-4
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2D and 3D Roughness Characterization

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Cited by 88 publications
(49 citation statements)
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“…The variety of describing the roughness of a surface offers even more possibilities: Semi-Variograms (e.g., Lianheng et al 2018;Babadagli and Develi 2003), power-spectral density (e.g., Babadagli and Develi 2003;Kanafi and Tuononen 2017) or wavelet decomposition (e.g., Mehrishal and Sharifzadeh 2013;Li et al 2019) are among them. Magsipoc et al (2020) and Gadelmawla et al (2002) provide an overview about surface roughness models.…”
Section: State Of the Art: (Semi-) Analytical Solutionsmentioning
confidence: 99%
“…The variety of describing the roughness of a surface offers even more possibilities: Semi-Variograms (e.g., Lianheng et al 2018;Babadagli and Develi 2003), power-spectral density (e.g., Babadagli and Develi 2003;Kanafi and Tuononen 2017) or wavelet decomposition (e.g., Mehrishal and Sharifzadeh 2013;Li et al 2019) are among them. Magsipoc et al (2020) and Gadelmawla et al (2002) provide an overview about surface roughness models.…”
Section: State Of the Art: (Semi-) Analytical Solutionsmentioning
confidence: 99%
“…Moreover, solely the largest amplitude over the length of the pin diameter is measured. The device, therefore, acts as a low-cut filter and band-pass filters the original surface trace (Maerz et al 1990). Indeed, all measuring approaches let them be contactless optical devices or tactile procedures do have a limited resolution and low-cut filtering is always happening.…”
Section: Measurement Quality Of the Original Type-profilesmentioning
confidence: 99%
“…Besides, individual authors used other statistical parameters, such as the standard deviation of the slope angles of each sampling step σ i (Yu and Vayssade 1991) or the ultimate slope of the profile λ, as a measure of the peak amplitude of the profile versus its projected length (Barton and de Quadros 1997). Examples of other parameters used more often than σ i and λ are the roughness profile index R p (Tatone and Grasselli 2010;Yu and Vayssade 1991;Maerz et al 1990) and the so-called Structure Function of the profile, termed SF (Tse and Cruden 1979;Yu and Vayssade 1991;Yang et al 2001). R p is defined as the ratio between the actual versus the projected length of the profile whereas SF can be calculated from Z 2 by introducing the sampling interval.…”
Section: Statistical Parametersmentioning
confidence: 99%
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