volume 54, issue spe, P39-44 1997
DOI: 10.1590/s0103-90161997000300008
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Abstract: ABSTRACT: The knowledge of the Leaf Area Index (LAI) variation during the whole crop cycle is essential to the modeling of the plant growth and development and, consequently, of the crop yield. Sugarcane LAI evolution models were developed for different crop cycles, by adjusting observed LAI values and growing degree-days summation data on a power-exponential function. The resultant equations simulate adequately the LAI behavior during the entire crop cycle. The effect of different water stress levels was cal…

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