2021
DOI: 10.1186/s13007-021-00726-5
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Determination of wheat spike and spikelet architecture and grain traits using X-ray Computed Tomography imaging

Abstract: Background Wheat spike architecture is a key determinant of multiple grain yield components and detailed examination of spike morphometric traits is beneficial to explain wheat grain yield and the effects of differing agronomy and genetics. However, quantification of spike morphometric traits has been very limited because it relies on time-consuming manual measurements. Results In this study, using X-ray Computed Tomography imaging, we proposed a m… Show more

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Cited by 25 publications
(15 citation statements)
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“…In such cases the "virtual shelling” enabled by X-ray technology could largely offset these hurdles. X-ray scanning is also suitable for evaluation of whole panicles (cereals) or pods (legumes) where it can offset the laborious process of grain threshing as shown before [ 20 , 21 , 25 , 34 , 35 , 42 ]. Also X-ray can be used for non-destructive evaluation of inner structures and physical properties of the grains, tubers etc.…”
Section: Discussionmentioning
confidence: 99%
“…In such cases the "virtual shelling” enabled by X-ray technology could largely offset these hurdles. X-ray scanning is also suitable for evaluation of whole panicles (cereals) or pods (legumes) where it can offset the laborious process of grain threshing as shown before [ 20 , 21 , 25 , 34 , 35 , 42 ]. Also X-ray can be used for non-destructive evaluation of inner structures and physical properties of the grains, tubers etc.…”
Section: Discussionmentioning
confidence: 99%
“…In spite of the fact that the current advanced technology of X-ray computed tomography has provided almost any kind of data required for geometric assessment of wheat grain e.g. see [ 15 18 ], utilizing this approach is time consuming, expensive, and limited to comparatively less available specific CT scanners. Moreover, reconstruction and analysis of 3D structures requires a more sophisticated level of image processing.…”
Section: Introductionmentioning
confidence: 99%
“…Furthermore, X-ray and CT imaging have been explored to non-destructively measure phenotypic traits of wheat spikes. Both X-ray and CT imaging can measure the inner structures of spikes and acquire information on grains (Duan et al, 2011 ; Xiong et al, 2019a ; Yu et al, 2021 ), which can be further used to distinguish and count the filled spikelets (Zhou et al, 2021 ). As for CT imaging, it can reconstruct spikes in three dimensions as well.…”
Section: Introductionmentioning
confidence: 99%