Abstract:“Curse of dimensionality” has become the major challenge for existing high-sigma yield analysis methods. In this article, we develop a meta-model using
Low-Rank Tensor Approximation (LRTA)
to substitute expensive SPICE simulation. The polynomial degree of our LRTA model grows linearly with the circuit dimension. This makes it especially promising for high-dimensional circuit problems. Our LRTA meta-model is solved efficiently with a robust greedy algorithm and calibrated iteratively wit… Show more
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