2007
DOI: 10.1103/physrevlett.99.206801
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Biased Surface Fluctuations due to Current Stress

Abstract: Direct correlation between temporal structural fluctuations and electron wind force is demonstrated, for the first time, by STM imaging and analysis of atomically resolved motion on a thin film surface under large applied current (10(5) A/cm2). The magnitude of the momentum transfer between current carriers and the geometrically constrained atoms in the fluctuating structure is at least 5x to 15x (+/-1sigma range) larger than for freely diffusing adatoms. Corresponding changes in surface resistivity will contr… Show more

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Cited by 25 publications
(17 citation statements)
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“…18-21 When a bias is applied across a conductor, charge carriers scatter against atomic defects such as surface step edges or adatoms 4,7,22 as shown in Fig. 1.…”
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“…18-21 When a bias is applied across a conductor, charge carriers scatter against atomic defects such as surface step edges or adatoms 4,7,22 as shown in Fig. 1.…”
mentioning
confidence: 99%
“…22,33 Due to this correlation, strong external field inhomogeneities are shown to often arise within a screening length surrounding an atomic defect (as illustrated in Fig. 1) and act to drive EM.…”
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confidence: 99%
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“…2(a)]. This metallic adatom will experience an electron wind force [18][19][20][21], and it will be driven along the exposed high-mobility crystal plane by the applied current [ Fig. 2(b)].…”
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confidence: 99%
“…fusion of atoms, the direct observation of electromigration effects in real time on atomistic length scales is difficult (see, however, [10] for recent progress in this direction). In this chapter the electromigration force will be used as a conceptually simple way of driving a system of surface steps out of equilibrium, giving rise to surprisingly complex dynamical behavior.…”
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confidence: 99%