2007
DOI: 10.1021/nl062631i
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Abstract: Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.

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Cited by 122 publications
(142 citation statements)
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References 27 publications
(57 reference statements)
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“…In the initial bowtie geometry [ Fig. 3(a)] the localized Joule heating within the narrow bridge causes an increased local temperature, which we estimate to be approximately 530 K (in rough agreement with other estimates [4,24,27]). The temperature rise of the bridge leads to increased gold mobility in that region, and a greater concentration of thermally excited adatoms and vacancies.…”
Section: Prl 100 056805 (2008) P H Y S I C a L R E V I E W L E T T Esupporting
confidence: 88%
See 1 more Smart Citation
“…In the initial bowtie geometry [ Fig. 3(a)] the localized Joule heating within the narrow bridge causes an increased local temperature, which we estimate to be approximately 530 K (in rough agreement with other estimates [4,24,27]). The temperature rise of the bridge leads to increased gold mobility in that region, and a greater concentration of thermally excited adatoms and vacancies.…”
Section: Prl 100 056805 (2008) P H Y S I C a L R E V I E W L E T T Esupporting
confidence: 88%
“…To establish that the gap forms by true electromigration during FCE, we conducted an experiment exploring the asymmetric nature of the gap formation process [9,17,24,25]. As seen in Fig.…”
mentioning
confidence: 99%
“…Such forces can act either constructively or destructively on a nanoscale device. Constructive work leads to the possibility of nanoscale engines, while destructive work can act as an activation mechanism for electromigration and device failure [17]. Nonconservative forces may be a prime candidate for explaining apparent heating in atomic wires [18,19] far above that expected from Joule heating alone [20,21].…”
Section: Introductionmentioning
confidence: 99%
“…[4][5][6] In particular, surface electromigration (EM) 7,8 often leads to the rapid breakdown of nanoscale conductors, 4,9 and is therefore a major reliability and performance concern in modern computer chip design. 3,9,10 For this reason, EM continues to attract a great deal of applied and fundamental research interest in physics, 4,11 chemistry, 5,11-13 materials science, 9,14 and nanoelectronics.…”
mentioning
confidence: 99%