“…[4][5][6] In particular, surface electromigration (EM) 7,8 often leads to the rapid breakdown of nanoscale conductors, 4,9 and is therefore a major reliability and performance concern in modern computer chip design. 3,9,10 For this reason, EM continues to attract a great deal of applied and fundamental research interest in physics, 4,11 chemistry, 5,11-13 materials science, 9,14 and nanoelectronics.…”