2006
DOI: 10.1016/j.tsf.2006.02.035
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On dielectric spectra of thin copper phthalocyanine films

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Cited by 11 publications
(5 citation statements)
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“…above 200 kHz can be addressed to a simple circuit composed of ideal resistance of R = 60 X and ideal capacitance of C = 1.7 nF connected in a series. Our previous investigations [19], as well as investigations presented in other works (e.g. [20]), indicate that this capacitance is pure geometric capacitance of a sample, while R is the real resistance of electrodes.…”
Section: Discussionsupporting
confidence: 56%
“…above 200 kHz can be addressed to a simple circuit composed of ideal resistance of R = 60 X and ideal capacitance of C = 1.7 nF connected in a series. Our previous investigations [19], as well as investigations presented in other works (e.g. [20]), indicate that this capacitance is pure geometric capacitance of a sample, while R is the real resistance of electrodes.…”
Section: Discussionsupporting
confidence: 56%
“…CuPc SML), ε 0 is the vacuum permittivity, and r is the disk radius. 13 From the literature, we find 7 > ε r > 2.1 for polycrystalline CuPc films, 59 which gives a cluster radius of 1.6 nm < r < 5.4 nm. For the in-plane CuPc dielectric constant (ε r = 13), 24,60 we find r = 0.8 nm.…”
Section: Resultsmentioning
confidence: 97%
“…To extract k CuPc , the thickness range 5-20 nm was used for simplicity. In this range, C h is given by equation (1): For the range of t CuPc analyzed (5-20 nm), k CuPc was found 4.5±0.5, slightly higher than the values reported for μm thick CuPc layers [38,39]. Considering that k CuPc depends on the molecular orientation [40][41][42], whereas the in-plane k CuPc is 10-20 and the perpendicular one is much lower (approximately 2-3.4), our values suggest a mild contribution of the in-plane field-induced dipole of CuPc to the measured k CuPc values.…”
Section: Resultsmentioning
confidence: 70%
“…For example, Saleh et al [37] obtained k CuPc ∼2.2 for a 0.4 μm thick layer, while Hamam et al [38] characterized CuPc layers and some derivatives of approximately 50 μm thickness, obtaining k CuPc ∼5.8. Jarosz et al [39] measured k CuPc values of approximately 3.5 for films thicker than 100 nm. At the molecular scale, k CuPc has been theoretically predicted though [40][41][42].…”
Section: Introductionmentioning
confidence: 98%