The correlative microscopy method based on a combination of optical and electronic techniques that is increasingly widely used now, has a number of limitations. Here, an alternative approach is considered that uses scanning probe microscopy (SPM) technique to get high-resolution and ultra-high-resolution data. SPM greatly increases the possibilities of collecting new information (on topological, morphological, electrical, magnetic etc. properties). To obtain three-dimensional distributions of different parameters of the sample, ultramicrotomography is used, which allows to scan the sample in steps of up to 20 nm. The principal advantage of the approach is that spectral data are used which due to the combination in near field microscopy can be gained with high and ultrahigh resolution. All above mentioned features are implemented in a single instrument, which allows to have 3-D data and their distributions at the same instrumental platform. A special feature of the approach is the possibility to use all the power of micro(nano)spectral methods. Therefore, it would be more correct to name the proposed approach "Correlative microspectroscopy".