The head-scatter factor (Sh) can be measured with a narrow miniphantom or a metal cap provided it is completely covered by the photon beam and its lateral size is thick enough to prevent electron contamination contributions. The effects of lateral electron equilibrium (LEE) and electron contamination on the Sh values were studied. The EGS4 Monte Carlo technique was used to calculate the minimum beam radii (rLEE) required to achieve complete LEE for photon beams ranging from 60Co to 24 MV. The measurement shows that the error introduced to the Sh value due to lateral electron disequilibrium is negligible. The radii of the miniphantoms or the sidewall thicknesses of the caps can be reduced below rLEE provided they are thick enough to prevent the effect of electron contamination.

Cumulative radiation damage to silicon semiconductor diode detectors can induce dose rate dependent sensitivity, a concern in the pulsed beam of a linac. Two p-Si diode photon detectors were used in this study, diodes A and B. Both were preirradiated by the supplier to 5 kGy, with diode A receiving an estimated 8 kGy from measurements, and diode B, 25 kGy. At 6 MV, the PDD measured with diode B was lower (by 4.4% at a depth of 25 cm) than diode A. Using SSD to vary the dose per pulse from 0.02 to 0.64 mGy/pulse, diode A was dose rate independent (within 2%), while the sensitivity of diode B changed by 13%. Silicon diode detectors should be checked regularly against ionization chambers in the pulsed beam of a linac, especially older high-resistivity diodes that have accumulated dose from high-energy photon beams.