We report results of glass transition (T(g)) measurements for polymer thin films using atomic force microscopy (AFM). The AFM mode, shear modulation force microscopy (SMFM), involves measuring the temperature-dependent shear force on a tip modulated parallel to the sample surface. Using this method we have measured the surface T(g) of thin (17-500 nm) polymer films and found that T(g) is independent of film thickness (t>17 nm), strength of substrate interactions, or even presence of substrate.

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The advent of user-friendly in-flight process diagnostic tools has significantly improved our understanding of thermal spray processes. This paper examines the critical attributes of these diagnostic measurements and the applicability of the nondimensional group parameters as a mapping strategy for data visualization. Specifically, first-order process maps (process-particle interactions) have been addressed by converting the temperature (T)-velocity (V) of particles obtained via diagnostics into nondimensional group parameters [Melting Index (MI)-Reynolds number (Re)]. This approach provides an improved description of the thermal and kinetic energy of particles and allows for cross comparison of diagnostic data within a given process for different materials, comparison of a single material across different thermal spray processes, and detailed assessment of the melting behavior through recourse to analysis of the distributions. An additional group parameter, Oxidation Index (OI), has been applied to relatively track the oxidation extent of metallic particles under different operating conditions.