Conductive nickel-cobaltite (Ni x Co 3-x O 4 ) thin films were synthesized on Al 2 O 3 substrates by using a solgel process for varying Ni composition x (B 1.0). X-ray diffraction data indicated that the polycrystalline Ni x Co 3-x O 4 samples have cubic spinel (Fd 3m) structure with the lattice constant increasing slightly with increasing Ni composition (by 0.5 % for x = 1.0 compared to that of Co 3 O 4 ). X-ray photoelectron spectroscopy data indicated that the Ni ions in nickel-cobaltite have multi-valence (Ni 2? and Ni 3? ). The temperature-dependent electrical resistivity (q) data of the nickel-cobaltite samples were measured in the 4-300 K range in comparison with Co 3
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