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This review describes the European Union and the US regulations applicable to food colours. Despite the different regulatory frameworks, the overall approach is similar, based on wellestablished risk-assessment procedures and risk-management measures. However, differences impacting free movement of goods can be found in the details and implementation of regulations. Using additives approved only in the US or in the EU implies that producers aiming to export need to adjust their product composition to the export market. Failure to comply may give rise to claims of adulteration, misbranding or non-compliance and rejection at the border or recall from the market. A careful comparison of the level of protection provided by the two sets of regulations, the criteria of good manufacturing practice (GMP) inspections and the certification requirements could be key to aligning the rules and to negotiating mutual recognition agreements. This review provides an extensive overview of the similarities and differences in regulating food colours in the EU and the US. ARTICLE HISTORY

Lanthanum gallate thin films were deposited by atomic layer epitaxy (ALE) at 325-425 uC from b-diketonatetype precursors, La(thd) 3 and Ga(acac) 3 , and ozone. Films were grown on soda lime glass, Si(100), MgO-buffered Si(100), sapphire, MgO(100), SrTiO 3 (100) and LaAlO 3 (100) substrates. Good control of film stoichiometry was obtained by adjusting the La(thd) 3 /O 3 to Ga(acac) 3 /O 3 pulsing ratio. Stoichiometric LaGaO 3 films contained only 0.4 at.% carbon and less than 0.2 at.% hydrogen as impurities. Films were transparent and uniform and their thickness could be accurately controlled by the number of deposition cycles. The as-deposited films were amorphous and became crystalline upon annealing. The annealed films grown on sapphire and MgO(100) substrates were polycrystalline LaGaO 3 whereas a La 4 Ga 2 O 9 phase was formed when the films grown on Si(100) and MgO-buffered Si(100) were annealed. Epitaxial and smooth LaGaO 3 thin films were obtained on LaAlO 3 (100) after annealing at 850 uC, verified by measurements of the X-ray rocking curve of the (200) reflection and the AFM surface roughness.

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