Aligned carbon nanotubes with open ends have been fabricated on silicon wafer in one step using a microwave plasma enhanced chemical vapor deposition system with a mixture of methane and hydrogen as precursors. High concentration hydrogen plasma and high negative bias voltage to the substrate induce anisotropic etching of carbon nanotubes and can effectively reduce the randomly oriented carbon nanotubes. The mechanism of aligned carbon nanotubes with open ends is proposed in this letter.
This study examined the effect of post-cue interval on directed forgetting and suppression. Experiments 1 and 2 used the item method of directed forgetting. The interval between the cue to remember/forget (R/F) and the presence of the next item was manipulated. As the post-cue interval increased, the rates of hits and 'remember' responses on the recognition test also increased not only for R items but also for F items, suggesting that participants did not stop processing F items after the F cue. Experiment 3 manipulated both the number of response/suppression attempts and the duration of response/suppression for each word pair during the response/suppression phase. The results showed that increasing the number of suppression attempts led to worse recall in the subsequent memory test. However, increasing the duration of suppression reduced the suppression effect. These results provide insights into a key factor for successful intentional forgetting and suppression.
Vertically aligned carbon nitride nanotubes with a uniform diameter of about 250 nm have been synthesized on a porous alumina membrane template (50–80 μm thick) in a microwave excited plasma of C2H2 and N2 using an electron cyclotron resonance chemical vapor deposition system. A negative dc bias voltage was applied to the substrate holder of graphite to promote the flow of ionic fluxes through the nanochannels of the alumina template. This allowed the physical, and subsequent chemical, absorption of species on the walls of the nanochannels that resulted in the formation of the carbon nitride nanotubes. The hollow structure and vertically aligned properties of the nanotubes have been clearly verified by field-emission scanning electron microscope images. The absorption band between 1250 and 1750 cm−1 in the Fourier transform infrared spectroscopy spectrum proves that nitrogen atoms have been incorporated into an amorphous network of carbon.
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