To cite this article: D Maneuski et al 2012 JINST 7 C01038 View the article online for updates and enhancements.
Related contentDepth of interaction and bias voltage depenence of the spectral response in a pixellated CdTe detector operating in timeover-threshold mode subjected to monochromatic X-rays E Fröjdh, C Fröjdh, E N Gimenez et al. ABSTRACT: In this work the results on imaging and spectroscopic performances of 14 × 14 × 1 mm CdTe detectors with 55 × 55 µm and 110 × 110 µm pixel pitch bump-bonded to a Timepix chip are presented. The performance of the 110 × 110 µm pixel detector was evaluated at the extreme conditions beam line I15 of the Diamond Light Source. The energy of X-rays was set between 25 and 77 keV. The beam was collimated through the edge slits to 20 µm FWHM incident in the middle of the pixel. The detector was operated in the time-over-threshold mode, allowing direct energy measurement. Energy in the neighbouring pixels was summed for spectra reconstruction. Energy resolution at 77 keV was found to be ∆E/E = 3.9%.Comparative imaging and energy resolution studies were carried out between two pixel size detectors with a fluorescence target X-ray tube and radioactive sources. The 110×110 µm pixel detector exhibited systematically better energy resolution in comparison to 55 × 55 µm. An imaging performance of 55 × 55 µm pixellated CdTe detector was assessed using the Modulation Transfer Function (MTF) technique and compared to the larger pixel. A considerable degradation in MTF was observed for bias voltages below −300 V. Significant room for improvement of the detector performance was identified both for imaging and spectroscopy and is discussed.
indicate techniques such as the scribe, cleave and passivate (SCP) and active edge processes offer real potential for reduced edge, tiled sensors for imaging detection applications.
Fröjdh, E. et al. (2012) Depth of interaction and bias voltage depenence of the spectral response in a pixellated CdTe detector operating in time-over-threshold mode subjected to monochromatic X-rays. Journal of Instrumentation, 7 (3).
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