We investigate the electronic structure of the GaN(101¯0) prototype surface for GaN nanowire sidewalls. We find a paradoxical situation that a surface state at all k points in the bandgap cannot be probed by conventional scanning tunneling microscopy, due to a dispersion characterized by a steep minimum with low density of states (DOS) and an extremely flat maximum with high DOS. Based on an analysis of the decay behavior into the vacuum, we identify experimentally the surface state minimum 0.6 ± 0.2 eV below the bulk conduction band in the gap. Hence, GaN nanowires with clean (101¯0) sidewall facets are intrinsically pinned.

A quantitative description of photoexcited scanning tunneling spectra is developed and applied to photoexcited spectra measured on p-doped nonpolar GaAs(110) surfaces. Under illumination, the experimental spectra exhibit an increase of the tunnel current at negative sample voltages only. In order to analyze the experimental data quantitatively, the potential and charge-carrier distributions of the photoexcited tip-vacuum-semiconductor system are calculated by solving the Poisson as well as the hole and electron continuity equations by a finite-difference algorithm. On this basis, the different contributions to the tunnel current are calculated using an extension of the model of Feenstra and Stroscio to include the light-excited carrier concentrations. The best fit of the calculated tunnel currents to the experimental data is obtained for a tip-induced band bending, which is limited by the partial occupation of the C 3 surface state by light-excited electrons. The tunnel current at negative voltages is then composed of a valence band contribution and a photoinduced tunnel current of excited electrons in the conduction band. The quantitative description of the tunnel current developed here is generally applicable and provides a solid foundation for the quantitative interpretation of photoexcited scanning tunneling spectroscopy.

The geometric and electronic structure of overgrown v-shaped defects in GaN epitaxial layers are investigated by cross-sectional scanning tunneling microscopy and spectroscopy. The v-defects are found to be hexagonal pit structures delimited by six f11 22g planes. The electronic properties are inhomogeneous. In some areas the center of the v-defects exhibits a strongly inhibited tunneling current, indicating the presence of deep traps. V

Local potential changes arising from nanoscale three-dimensional spatial fluctuations in the dopant distribution in Zn-doped GaAs were investigated quantitatively by scanning tunneling microscopy and spectroscopy at (110) cleavage surfaces. Tunneling spectra measured in areas with different local doping concentration show apparent shifts of the valence band edge and apparent changes of the band gap. A quantitative analysis, combined with band bending and tunnel current simulations, demonstrates that these effects arise from tip-induced band bending that modulates the real potential changes. It is illustrated how exact potential changes between locally high and low doped areas can be determined. It is found that the local potential fluctuations in three-dimensionally doped semiconductors are approximately one order of magnitude smaller that those observed in two-dimensionally doped semiconductors.

The spatial distribution and the projected line directions of dislocations intersecting a crosssectional ð10 10Þ cleavage plane of a GaN(0001) epitaxial layer is mapped using scanning tunneling microscopy. The data is correlated with the spatial positions of v-shaped defects. The dislocations are found to be bent away from the inclined semipolar facets of v-shaped defects, due to a strain-induced repulsive interaction. The dislocation distribution is characterized by agglomerations and intersecting bundles of dislocations with parallel projected line directions, stabilized by many body effects in the repulsive strain interactions. V