SUMMARYThis paper presents a new method of test pattern generation for detecting crosstalk faults. In general, to detect crosstalk faults, two successive test vectors are needed for exciting and propagating the crosstalk fault. A special signal corresponding to the two successive vectors is designed to simplify the test pattern generation algorithm and its implementation. By taking into consideration gate delay, more accurate test pattern generation can be expected. The algorithm was implemented in a C++ program, and applied to a few benchmark circuits. The experiments show that coverage for large-scale integrated circuits is at least 70 percent, and for small-scale integratedcircuits up to 90 percent.
SUMMARYAccompanying high-integration and high-speed implementation of VLSI in recent years, new faults which cannot be classified in the category of conventional fault models have become a problem. Among these new faults, we will deal with crosstalk faults in this paper. Because of excitation and propagation of the crosstalk faults in the detection of these faults, two successive test vectors are required and thus their generation is difficult. Moreover, it is necessary in the sequential circuit to consider the problem of timing such as gate delay time and FF setup time in the circuit. For that reason, it has been difficult to realize a high fault coverage in the test vector generation methods proposed so far. To solve these problems, we will newly propose in this paper a Built-In Self-Test (BIST) method which can detect the crosstalk faults. This method can be realized by a relatively small area overhead; moreover, by adopting a circuit configuration during simulation which is different from the one during test, the simulation time is shortened. In this way, testing of large-scale circuits has been made possible. We have performed an evaluation on the fault coverage for several benchmark circuits and shown that this method is effective for crosstalk faults.
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