Modern wheat is lacking diversity in the D genome due to the genetic bottleneck from the hybridization between tetraploid Triticum turgidum L. and diploid Aegilops tauschii Coss. The D‐genome nested association mapping (DNAM) population (Reg. no. MP‐14, NSL 536301 MAP) was developed to expand D‐genome variation in hexaploid wheat (Triticum aestivum L.). The DNAM population is a wheat nested association mapping population developed with direct crosses between the hard‐white winter Kansas State University breeding line KS05HW14‐3 and Ae. tauschii accessions TA10187, TA1693, TA10171, TA1662, TA1617, TA1615, TA1642, and TA1718. In total, there are 1,164 BC₂F₄ recombinant inbred lines (RILs) in 19 families. The DNAM was originally created for introgression of novel stem rust resistance genes but has since been used to identify resistance to other fungal pathogens. A subset of 420 lines were selected for important agronomic traits, including height and threshability, and named the DNAM Core RILs. Research with the DNAM has potential to provide novel genes that can be introgressed into elite cultivars, as well as knowledge and understanding of the D genome in wheat.
In recent years, stripe rust has become an increasingly problematic disease affecting wheat (Triticum aestivum L.). Although stripe rust resistance genes Yr28 and YrAS2388R have been successfully transferred from Aegilops tauschii Coss. to hexaploid wheat, these genes have not been widely used for stripe rust resistance breeding largely due to a lack of publicly available and well‐adapted germplasm. Here we describe U6719‐004 (Entry 538 of D‐genome nested association mapping population, Reg. No. MP‐14, NSL 536301 MAP), a hexaploid wheat germplasm carrying YrAS2388R stripe rust resistance derived from Ae. tauschii accession TA1718 that is well adapted to U.S. wheat production environments. U6719‐004 (KS05HW14‐3/3/KS05HW14‐3/TA1718//KS05HW14‐3) was developed using a combination of direct hybridization of TA1718 with the hard white winter wheat line KS05HW14‐3 followed by two rounds of backcrossing and three generations of single seed descent. U6719‐004 stripe rust resistance was characterized under controlled and natural conditions. Using gene‐based markers, TA1718 and U6719‐004 were confirmed to be YrAS2388R carriers. Grain yield for U6719‐004 was evaluated in 11 year‐by‐location environments across the United States. Grain quality parameters were measured in four year‐by‐location environments. Compared with the recurrent wheat parent KS05HW14‐3 and locally adapted check cultivars, the Ae. tauschii introgression had little to no impact on U6719‐004 grain yield or quality. The availability of U6719‐004 will enable the use of YrAS2388R for stripe rust resistance breeding efforts.
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