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We demonstrate 128 Gbps/port (8-λ × 16 Gbps/λ) natively error-free transmission across eight optical ports using a 8-port, 8-λ/port WDM remote laser source and a pair of monolithically integrated CMOS optical I/O chiplets with 4.96-5.56 pJ/bit optical Tx+Rx chiplet energy efficiency.

Amplitude modulated atomic force microscopy (AM-AFM) was used to examine the influence of the size of the AFM tip apex on the measured surface topography of single highly oriented pyrolytic graphite (HOPG) atomic steps. Experimental measurements were complemented by molecular dynamics simulations of AM-AFM and the results from both were evaluated by comparison of the measured or simulated width of the topography at the step to that predicted using simple rigid-body geometry. The results showed that the step width, which is a reflection of the resolution of the measurement, increased with tip size, as expected, but also that the difference between the measured/simulated step width and the geometric calculation was tip size dependent. The simulations suggested that this may be due to the deformation of the bodies and the effect of that deformation on the interaction force and oscillation amplitude. Overall, this study showed that the resolution of AM-AFM measurements of atomic steps can be correlated to tip size and that this relationship is affected by the deformation of the system.

The interaction potential between two surfaces determines the adhesive and repulsive forces between them. It also determines interfacial properties, such as adhesion and friction, and is a key input into mechanics models and atomistic simulations of contacts. We have developed a novel methodology to experimentally determine interaction potential parameters, given a particular potential form, using frequency-modulated atomic force microscopy (AFM). Furthermore, this technique can be extended to the experimental verification of potential forms for any given material pair. Specifically, interaction forces are determined between an AFM tip apex and a nominally flat substrate using dynamic force spectroscopy measurements in an ultrahigh vacuum (UHV) environment. The tip geometry, which is initially unknown and potentially irregularly shaped, is determined using transmission electron microscopy (TEM) imaging. It is then used to generate theoretical interaction force–displacement relations, which are then compared to experimental results. The method is demonstrated here using a silicon AFM probe with its native oxide and a diamond sample. Assuming the 6-12 Lennard-Jones potential form, best-fit values for the work of adhesion (W adh) and range of adhesion (z 0) parameters were determined to be 80 ± 20 mJ/m2 and 0.6 ± 0.2 nm, respectively. Furthermore, the shape of the experimentally extracted force curves was shown to deviate from that calculated using the 6-12 Lennard-Jones potential, having weaker attraction at larger tip–sample separation distances and weaker repulsion at smaller tip–sample separation distances. This methodology represents the first experimental technique in which material interaction potential parameters were verified over a range of tip–sample separation distances for a tip apex of arbitrary geometry.

Friction in nanoscale contacts is determined by the size and structure of the interface that is hidden between the contacting bodies. One approach to investigating the origins of friction is...